Jean-Nicolas Audinot oral presentation (SN3-Thu4-2-4)
Secondary Ion Mass Spectrometry on the Helium Microscope: new methodologies for the analysis of nanomaterials
1 Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, 4422 Belvaux, Luxembourg
2 Luxembourg Institute of Science and Technology (LIST), 40 rue du brill, 4122 Belvaux, Luxembourg
The last two decades, engineered nanomaterials have become the focus of intensive research in diverse areas, including cosmetics, textiles, electronics devices, materials engineering, energy production, surface cleaning, aerospace, and medical applications. The current trend in nanotechnology is the chemical and/or structural modification of materials so that they present specific desired properties such as reduction/increase of redox potential, modification of the conductive or/and ferroelectric properties, surface properties, etc.
To allow for the characterization of such nanomaterials, we developed specific methodologies for the Helium Ion Microscope (HIM) equipped with a specifically developed SIMS spectrometer [1-2]. This microscope is capable of producing elemental SIMS maps with sub-20 nm lateral resolution, thus approaching the physical resolution limits resulting from the dimensions of the collision cascades, while maintaining a sub-nanometric resolution in the secondary electron imaging mode. We have performed HIM-SIMS analyses on nanomaterials used for several applications related to micro-electronics, batteries, solar cells , coatings and developed in parallel different correlative strategies and methods to synergistically profit of both capabilities of the HIM-SIMS instrument, i.e. imaging detecting secondary electrons and secondary ions, .
We will present four broad categories of novel nanomaterials characterized by HIM-SIMS: the latest technology solar cells, promising retinal implants, composite materials for cutting tools and creams to protect and nourish the skin.
 G. Hlawacek, A. Gölzhäuser, Helium Ion Microscopy, Springer, 2017
 T. Wirtz, D. Dowsett, P. Philipp, Helium Ion Microscopy, edited by G. Hlawacek, A. Gölzhäuser, Springer, 2017
 P. Gratia, G. Grancini, J.-N. Audinot, X. Jeanbourquin, E. Mosconi, I. Zimmermann, D. Dowsett, Y. Lee, M. Grätzel, F. De Angelis, K.Sivula, T. Wirtz, M. K. Nazeeruddin, J. Am. Chem. Soc. 138 (49), 2016, 15821–15824
 T. Wirtz, P. Philipp, J.-N. Audinot, D. Dowsett, S. Eswara, Nanotechnology 26, 2015, 434001