Sébastien CREMEL oral presentation (OA3-Tue1-3-6)
D-SIMS (and other surface analysis methods) in support to industrialization of steel for Automotive and Packaging applications
ArcelorMittal Global R&D, Voie Romaine, 57280 Maizieres les Metz, France
Along with other surface specific techniques, Secondary Ion Mass Spectroscopy is used in ArcelorMittal Research & Development laboratories as a powerful tool to answer a large scope of questions in relation with product development and quality control, mainly in the field of high added-value coated steels for Automotive and Packaging applications.
The aim of this general communication is to show some examples of capability of Dynamic SIMS both in depth profiling and mapping modes. SIMS helps resolving questions in various studies such as: surface aspect (tarnishing) (fig1), surface treatment or conversion layer covering (fig2), Hot Dip Galvanized (HDG) steels surface oxidation, grain boundaries alloying elements enrichment and surface selective oxidation…