Paula Peres oral presentation (OA2-Mon4-3-5)
Dynamic SIMS for Materials Analysis in Nuclear Science
1 CAMECA, 29 Quai des Gresillons, 92230 Gennevilliers, France
2 CEA Nuclear Energy Division, Cadarache, 13115 Saint-Paul-lez-Durance, France
3 Institut de Physique Nucléaire de Lyon (IPNL), Rue Enrico Fermi, 69622 Villeurbanne, France
4 Institut de Radioprotection et de Sûreté Nucléaire (IRSN), Cadarache, 13115 Saint-Paul-lez-Durance, France
5 CEA DAM DIF, Bruyères-le-Châtel, 91297 Arpajon, France
Offering extreme sensitivity, high depth and lateral resolution together with high throughput, dynamic SIMS (Secondary Ion Mass Spectrometry) proves extremely useful for a wide range of nuclear science applications:
• Study of fission products behavior in irradiated nuclear fuels
• Characterization of plasma facing materials in fusion devices
• Investigation of long-term behavior of nuclear materials for safe waste disposal
• Uranium isotope analysis on safeguards environmental samples.
• Study of uranium accumulation processes in human tissues and cells.
The CAMECA IMS 7f-Auto is a versatile magnetic sector SIMS well suited for these applications. It offers depth profiling with excellent detection limits (ppb to ppm) and high depth resolution; elemental as well as isotopic information ranging from low mass (H) to high mass species (Pu and above); unique sub-μm resolution 2D and 3D imaging capabilities; as well as high throughput and automation. CAMECA also offers a Shielded IMS specifically developed for the analysis of highly radioactive samples.
In the example below, SIMS imaging measurements were performed on a cerium dioxide (CeO2) disk sample annealed at 1400°C for four hours after xenon implantation. CeO2 is usually considered as a non-radioactive surrogate of UO2 ceramics to simulate the properties of nuclear fuels during irradiation processes or long term storage.
Different applications covered by the CAMECA IMS 7f-Auto for materials analysis in nuclear science will be presented.