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SIMS21, Poland 2017 - Mikołaj Gołuński abstract

Mikołaj Gołuński oral presentation (FN1-Mon3-2-2)

Computer Modelling of Free-Standing Graphene Bombarded with keV C60 Projectiles

Mikołaj Gołuński, Zbigniew Postawa

Jagiellonian University - Institute of Physics, prof. Stanisława Łojasiewicza 11, 30-348 Kraków, Poland

Researchers around the globe are constantly looking for new ways of performing SIMS analysis, which could provide more accurate, more efficient, and more organic-friendly results. One of the attempts is through the novel, “transmission” geometry combined with the ultra-thin substrates. Single- and multi-layer graphene is a promising material for use as a support in such substrates.

Computer simulations can explore the processes taking place during ion bombardment. Being able to see not only the result of our actions, but also trace mechanisms responsible for material modification, is an invaluable advantage of this technique which helps in understanding the physics behind.

Molecular Dynamics (MD) simulations were already performed for single cases of graphene bombardment in the “transmission” geometry. [1-3] Nevertheless, so far there is no systematic study, which shows how such structure behaves in a wider range of bombardment conditions. The MD simulations of C60 buckminsterfullerene projectile bombardment of single- and multi-layer graphene substrates will be performed. Ejection of particles both in “reflection” and “transmission” directions will be analysed to elucidate the effect of the projectile primary kinetic energy and the impact angle on the material ejection characteristics.

[1] S. V. Verkhoturov, S. Geng, B. Czerwinski, A. E. Young, A. Delcorte, and E. A. Schweikert, J. Chem. Phys., vol. 143, no. 16, p. 164302, 2015.

[2] M. Golunski, S. V. Verkhoturov, D. S. Verkhoturov, E. A. Schweikert, and Z. Postawa, Nucl. Instruments Methods Phys. Res. Sect. B Beam Interact. with Mater. Atoms, vol. 393, pp. 13–16, 2017.

[3] S. V. Verkhoturov, B. Czerwinski, D. S. Verkhoturov, S. Geng, A. Delcorte, and E. A. Schweikert, J. Chem. Phys., vol. 146, no. 8, p. 84308, 2017.

This work was supported by NCN, grant nr 2016/23/N/ST4/00971.