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SIMS21, Poland 2017 - Poster sessions

SIMS21, Poland - Poster sessions

Tuesday
Fundamentals
FN1-Tue-P1
Comparison of the Relative Ion Yield of Common Primary Beams used in Secondary Ion Mass Spectrometry on Organic and Inorganic Surfaces
Allen Bellew, Paul Blenkinsopp
FN1-Tue-P2
Micro- and Macroscopic Modeling of Sputter Depth Profiling
Dawid Maciazek, Barbara J. Garrison, Zbigniew Postawa
FN1-Tue-P3
A Study on the Secondary Ionization Efficiency of Various Molecular Gas Cluster Ion Beam generated by Resonant 2 Photon Ionization
Chang Min Choi, Jung-Hwan Kim, Sang Ju Lee, Eun Ji Park, Ji Young Baek, Myoung Choul Choi
FN1-Tue-P4
Analysis of OLED materials using TOF-SIMS for characteristic study of GCIB
JI YOUNG BAEK, Jung-Hwan Kim, Chang Min Choi, Sang Ju Lee, Eun Ji Park, Myoung Choul Choi
FN1-Tue-P5
Secondary Neutral Mass Spectrometry with MeV and keV projectiles
Lars Breuer, Jordan Oswald Lerach, Markus Bender, Daniel Severin, Nicholas Winograd, Andreas Wucher
FN1-Tue-P6
SIMS analysis of steel samples with neutral caesium dosing
Maciej Miśnik, Joachim Ażgin, Piotr Konarski
FN3-Tue-P7
In-house reference materials for the determination of low titanium concentration in SiO2 by secondary ion mass spectrometry
Hao Sheng Wu
FN2-Tue-P8
A python library for advanced data analysis of ToF-SIMS and SPM data
Olivier Scholder, Hans Josef Hug, Laetitia Bernard
FN2-Tue-P9
Higher spatial resolution by image fusion of ToF-SIMS and microscopic images
Kazuma Takahashi, Takayuki Yamagishi, Dan Aoki, Kazuhiko Fukushima, Satoka Aoyagi
FN3-Tue-P10
Monitoring Nitrogen in Nickel Thin Films with ToF-SIMS
Lukas Volgger, Paul Frank, Herbert Hutter
FN3-Tue-P11
Carbon quantification in a dissimilar steel weld.
Nathalie VALLE, Brahime El ADIB, Fanny MAS, Catherine TASSIN
FN3-Tue-P12
An effect of residual gas component on detected secondary ions during TOF-SIMS depth profiling and a method to estimate contained component
Junichiro Sameshima, Yoshitsugu Nakagawa
FN3-Tue-P13
Measurement of Sodium Concentration in Polymer Thin Films by means of TOF-SIMS and Sputtering with Large Oxygen Clusters
Stefan Schwab, Maximilian Bonta, Thomas Anderl, Andreas Limbeck, Sven Kayser, Julia Zakel, Holger Doepke, Stefan Miethaner, Michael Bauer, Michael Nelhiebel, Herbert Hutter
Organic and Biological
OB1-Tue-P14
Organic signal recovery using an argon cluster ion beam
Mariavitalia Tiddia, Guido Mula, Ichiro Mihara, Rasmus Havelund, Ian S Gilmore
OB1-Tue-P15
Characterization of surface modifier using TOF-SIMS with Ar-GCIB depth profiling
Kazutaka Ishikawa, Masayuki Okamoto, Rui Takahashi
OB2-Tue-P16
Polyatomic Ion Beam Depth Profiling of Polymeric Materials with Secondary Ion Mass Spectrometry – Effects of Projectile Parameters and Sample Temperature
Huriyyah Alturaifi, Daniel Tate, Adam Parry, Michael Turner, Nick Lockyer
OB2-Tue-P17
Temperature Behaviour of Arn+ Clusters Backscattered from the Surface of Polymers
Claude J-L POLEUNIS, Vanina CRISTAUDO, Arnaud DELCORTE
OB2-Tue-P18
Effect of Thermal and Solvent Annealing on Surface Properties and Structures of Various Diblock Copolymer Films
Minjung Kim, Jihye Lee, Se-Bi Jung, Tanguy Terlier, Kang-Bong Lee, Yeonhee Lee
OB2-Tue-P19
Formation of microdendritc pattern on poly(methyl metacrylate) post sputtered surface.
Pawel Mateusz Dabczynski, Jakub Rysz, Benedykt Ryszard Jany, Franciszek Krok, Mateusz Marek Marzec, Andrzej Bernasik, Andrzej Budkowski
OB2-Tue-P20
Interdiffusion of C60 Fullerene Derivative in Conjugated Polymer Thin Films under Solvent Vapour Annealing.
Pawel Mateusz Dabczynski, Monika Biernat, Jakub Rysz, Mateusz Marek Marzec, Andrzej Bernasik, Andrzej Budkowski
OB3-Tue-P21
3D OrbiSIMS imaging of Drosophila cuticular lipids
Clare Newell, Melissa K. Passarelli, Andrew P. Bailey, Ian S. Gilmore, Alex P. Gould
OB3-Tue-P22
Multiplex SIMS imaging of Proteins and Lipids in Mouse Hippocampal Tissues
Sun Young Lee, Eun Soek Seo, Young Ho Park, Su Il In, Dae Won Moon
OB3-Tue-P23
Secondary Ion Mass Spectrometric Imaging of Fat Metabolites in Drosophila miRNA Mir-14 Model
Minh Uyen Thi Le, Jin Gyeong Son, Hyun kyong Shon, Jeong Hyang Park, Sung Bae Lee, Tae Geol Lee
OB4-Tue-P24
Adsorption Studies of BSA in Polymer Thin Films Inducing High Expression of Stem Cells
Jin Gyeong Son, Minsuk choi, SeungJung Yu, Sung Gap Im, Sangyong Jon, taegeol lee
OB3-Tue-P25
Chemical imaging for the study of the neuronal differentiation process
Sanna Sämfors, Andrew G Ewing
OB3-Tue-P26
Molecular depth profiling on rat brain tissue sections prepared by different sampling methods
Hyun Kyong Shon, Shin Hye Kim, Sohee Yoon, Chan Young Shin, Tae Geol Lee
OB4-Tue-P27
TOF-SIMS analysis of cancer-associated metabolites in cells
Jungdae Park, Hee-Kyung Na, Hyun Kyong Shon, Hye Young Son, Sang-Won Lee, Yong-Min Huh, Tae Geol Lee
OB4-Tue-P28
Evaluation of matrix effects on ToF-SIMS data of peptide and lipid mixed samples
Shusuke Nakano, Hideo Iwai, Takayuki Yamagishi, Satoka Aoyagi
OB4-Tue-P29
An Innovative Strategy to Rescue the Hippocampal Bioenergetics in a Rat Model of Parkinson’s Disease: Utilizing Plasmon-activated Water as a Natural Approach
Ting-Yi Renn, Hung-Ming Chang, Li-You Chen, Fu-Der Mai, Yu-Chuan Liu
Semiconductors, Metals and Nanomaterials
SN1-Tue-P30
3D imaging of silicon precipitates in aluminium contacts
Michal Potoček, Radek Holeňák, Juraj Karlovský, Radim Pechal, Adam Klimsza, Petr Bábor, Tomáš Šikola
SN1-Tue-P31
Study on Quadrupole SIMS Depth Profiling of Nitrogen in Oxides
Michinori Suehara, Daisuke Kobayashi, Tsuguhide Isemura
SN1-Tue-P32
Nanoscale Investigation of Oxidation of AlB2 Surface: Complementary Study with Cluster Single Impacts and Atomic Ion SIMS
Stanislav V Verkhoturov, Mohammad Humood, Dmitriy S Verkhoturov, Michael Eller, Andreas A Polycarpou, James D Batteas, Emile A Schweikert
SN1-Tue-P33
The characterization of oxygen diffusion (Na1/2Bi1/2)TiO3 piezo-ceramics by Time-of-Flight secondary ion mass spectrometry
Sebastian Steiner, Oded Sobol, Karsten Albe, Till Froemling, Wolfgang Unger
SN1-Tue-P34
Skutterudite thermoelectric multilayers characterized by SIMS
Jan Lorincik, Daniela Vesela, Jan Remsa, Miroslav Jelinek
SN1-Tue-P35
Research of interaction features in the multilayer Al-Ni structures using time of flight secondary ion mass spectrometry (TOFSIMS)
Andrey Goryachev, Daria Dronova, Dmitriy Gromov, Egor Lebedev, Sergey Dubkov, Anna Presnukhina
SN2-Tue-P36
SIMS applications to advanced doping processes of semiconductors
Enrico Napolitani
SN2-Tue-P37
Quantitative low energy depth profiling of semiconductor and semi-isolating structures using Optical Conductivity Enhancement.
Alexander Merkulov, Beatrice Salle, David Larsson, Michel Schuhmacher
SN3-Tue-P38
Fabrication of 3-dimentional organic micro-patterns for SIMS depth profiling by maskless AFM indentation technique
Jung-Hwan Kim, Seunghyun Moon, ChangMin Choi, Eun Ji Park, Sang Ju Lee, Ji Young Baek, ChaeHo Shin, Myoung Choul Choi
SN3-Tue-P39
3D tomography of coated spherical metal oxide particles with delayed extraction
Felix Walther, Kaija Anne Schaepe, Marcus Rohnke, Jürgen Janek
SN3-Tue-P40
The effect of gas cluster ion beam treatment on ligand-stabilized gold nanoparticle array
Eun Ji Park, Chang Min Choi, Il Hee Kim, Jung-Hwan Kim, Sang Ju Lee, Ji Young Baek, Young Dok Kim, Myoung Choul Choi
Other Applications
OA1-Tue-P41
CAMECA IMS 1300-HR3: The New Generation Ion Microprobe
Paula Peres, Seo-Youn Choi, Firmino Fernandes, Ludovic Renaud
OA1-Tue-P42
Development of a Super-SIMS for geological applications
René Ziegenrücker, Shavkat Akhmadaliev, Georgii Belokonov, Johannes von Borany, Roman Böttger, Jens Gutzmer, Peter Kaever, Markus Meyer, Pavol Noga, Axel D. Renno, Georg Rugel, Andreas Scharf, Collin J. Tiessen, Jörg Voigtländer, Nicole Wagner, Michael Wiedenbeck, Armin Winter, Hao Sheng Wu
OA1-Tue-P43
Support for the Black Mat Cosmic Airburst in the Western Alps during the Late Glacial period from imaging Time-of-Flight Secondary Ion Mass Spectrometry.
Rana N Sodhi, Peeter Somelar, William C Mahaney
OA1-Tue-P44
Recent advances in Secondary ion mass spectrometry (SIMS) in geochemistry and cosmochemistry
Svetlana Shilobreeva
OA2-Tue-P45
Forensic investigation on human evidences using ToF-SIMS
Tanguy Terlier, Seonhee Kim, Jihye Lee, Yeonhee Lee
OA2-Tue-P46
ToF-SIMS studies of drug contaminated fingerprints transferred from different surfaces using adhesive lifters
Małgorzata Iwona Szynkowska, Katarzyna Osingłowska, Jacek Rogowski, Elżbieta Maćkiewicz, Aleksandra Pawlaczyk, Andrzej Parczewski
OA2-Tue-P47
Investigation of different forensic samples using TOF-SIMS technique
ALEKSANDRA EWA PAWLACZYK, JACEK ROGOWSKI, ELŻBIETA MAĆKIEWICZ, KATARZYNA OSINGŁOWSKA, MARTA MARCINEK-JACEL, KATARZYNA TYCZKOWSKA, ANDRZEJ PARCZEWSKI, MAŁGORZATA IWONA SZYNKOWSKA
OA2-Tue-P48
Identification and analysis of microscopic uranium oxide particles using fission tracks, FIB-SEM, and SIMS
Kristína Sihelská, Klára Řezánková, Petr Homola, František Sus, Jan Lorinčík
OA2-Tue-P49
In-Situ Mass Spectrometry, Chemical and Morphological Co-located Analysis of Particles of Safeguards Interest
Ernesto Chinea Cano, Thippatai Tanpraphan, Matvey Aleshin, Olivier Bildstein, Laure Sangely, Jane Poths
OA2-Tue-P50
Integrity of Nuclear Safeguards Samples during SIMS Analysis: Good Practices in Sample Preparation and Process Blank Monitoring
Thippatai Tanpraphan, Matvey Aleshin, Olivier Bildstein, Laure Sangely, Jane Poths
Industrial Session
OA3-Tue-P51
Benefit of ToF-SIMS analysis in understanding surface modification by oxi-fluorination
Sylvain MINOT, Charlène LAMBARE, Delphine PAVON, Benoît POUDEVIGNE, Corinne Gablin, François BESSUEILLE, Jacques MAGUIN, Isabelle FERREIRA, Didier LEONARD
OA3-Tue-P52
ToF-SIMS investigation of tribological boundary layers built up by finishing processing with specially added cooling lubricants
Lukas G. H. Britt, Philipp K. Jenke, Dieter Lipinsky, Benedikt Seidel, Ekkard Brinksmeier, Heinrich F. Arlinghaus
OA3-Tue-P53
Understanding carbonaceous deposits
Emma Antonio, Sarah Fearn, Sorin V Filip, Mary P Ryan, Sandrine Heutz
OA3-Tue-P54
Quantitative evaluation of chemical species existing on the polymer surface using TOF-SIMS.
Hiroto Ito
OA3-Tue-P55
Embedding-free cross-sectioning method of organic materials for micro chemical analysis using gas cluster ion beam sputtering
Ichiro Mihara, Rasmus Havelund, Ian S Gilmore
OA3-Tue-P56
Evaluation of transmutation detector response using SIMS
Jan Lorincik, Petr Homola, Ladislav Viererbl, Vít Klupák, Zdena Lahodová
Pushing the Boundaries
PB1-Tue-P57
Time-of-flight mass spectrometer using cold electron ionization source
Seung yong Kim, Wanseop Jeong, Myoung Yeo, Bongyoon Yi, Byeongwon Kang, Hyun Sik Kim, Mo Yang
PB1-Tue-P58
Designing mixed clusters: Towards enhanced ionization in SIMS
Konstantin Moshkunov Aleksandrovich, Arnaud Delcorte
PB1-Tue-P59
Measuring the mass distribution of massive Ar cluster ion using two rotating electric fields type mass spectrometer
Kousuke Moritani, Masashi Nojima, Msanao Hotta, Satoshi Kurumi, Kaoru Suzuki, Tatsuya Adachi, Takashi Kusanagi
Related Methods
RM-Tue-P60
Atom probe conditions for stoichiometric quantification of GaN and Al1 xGaxN
Richard Morris, Laurent Arnoldi, Ramya Cuduvally, Davit Melkonyan, Claudia Fleischmann, Ming Zhao, Wilfried Vandervorst
RM-Tue-P61
Tuning adsorption of carboxylic acids to anatase TiO2
Mariana Cecílio de Oliveira Monteiro, Patrik Schmuki, Manuela Sonja Killian
RM-Tue-P62
A combined SPM/TOFSIMS tool to obtain real chemical 3D information
Valentina Spampinato, Masoud Dialameh, Claudia Fleischmann, Alexis Franquet, Thierry Conard, Wilfried Vandervorst


Thursday
Fundamentals
FN1-Thu-P1
Influence of the shave-off scan speed on the cross sectional shape
So-Hee Kang, Yun Kim, Bunbunoshin Tomiyasu, Masanori Owari
FN1-Thu-P2
Polymer-matrix nanocomposites bombarded by large Ar clusters and low energy Cs ions: Sputtering yields and topography development
Ryan Edwards, Henok Mebratie Mesfin, Eva Pospisilova, Claude Poleunis, Arnaud Denis Delcorte
FN1-Thu-P3
Influence of the cluster constituents' reactivity on the desorption/ionization process induced by SO2 clusters
Andre Portz, Markus Baur, Christoph Gebhardt, Michael Dürr
FN1-Thu-P4
Influence of the activation method on the composition and emission properties of Pd-Ba alloys
Sardor Burkhanovich Donaev, Dilnoza Artikbaevna Tashmukhamedova, Baltohodja Ermatovich Umirzakov
FN1-Thu-P5
Secondary Ion Formation Under Electronic and Nuclear Sputtering Conditions
Matthias Herder, Philipp Ernst, Lars Breuer, Markus Bender, Daniel Severin, Marika Schleberger, Andreas Wucher
FN2-Thu-P6
Correlative Microscopy and Image Fusion: Methodology and Applications
Jean-Nicolas Audinot, Florian Vollnhals, Santhana Eswara, Tom Wirtz
FN2-Thu-P7
Simultaneous measurement of impurities and composition by SIMS-OES
Takashi Miyamoto, Shigenori Numao, Junichiro Sameshima, Yoshitsugu Nakagawa, Koji Mizoguchi, Masanobu Yoshiakwa
FN3-Thu-P8
Quantitative Analysis of FeNi and SiGe Alloy Films by SIMS and XPS
Kyung Joong Kim, Kyung Min Do, Won Jin Oh, Youn Seoung Lee, Ansoon Kim
FN3-Thu-P9
Application of the ToF-SIMS full spectrum method in quantitative depth profiling of InGaN/GaN Multiple Quantum Wells
Bin Gong, Christopher E Marjo
FN1-Thu-P10
SIMS Study of Yn+ and YnOm+ Clusters Emitted under Ion Bombardment
Sergey Maksimov, Nariman Dzhemilev, Sergey Kovalenko, Oskar Tukfatullin, Sherali Khozhiev, Vladimir Rotstein
Organic and Biological
OB1-Thu-P11
Study of Lipid Composition Changes in Bacteria due to Stress and Genetic Modification using ToF-SIMS
Kelly Dimovska Nilsson, Patrick M Wehrli, Johan Gottfries, Anne Farewell, John Stephen Fletcher
OB1-Thu-P12
ToF-SIMS analysis of mosquito netting and ion implanted quantification standard with argon gas cluster ion beam
Chuanzhen Zhou, Fred Stevie, Stephen C Smith, Derk Rading, Julia Zakel
OB1-Thu-P13
Determination of Chemical Composition in Multilayer Polymer Film using TOF SIMS
Chuanzhen Zhou, Dayong Sun, Roberto Garcia, Fred Stevie
OB2-Thu-P14
Argon gas cluster ion beam depth profiling combined with X-ray and UV photoemission spectroscopy for interface characterization in thin polymer multilayer systems
Mateusz Marek Marzec, Jakub Rysz, Paweł Dąbczyński, Andrzej Budkowski, Andrzej Bernasik
OB2-Thu-P15
Investigation of X-ray damage on Esterase-Fat-layers by ToF-SIMS
Sabine Hirth, Pia Mühlbeier-Entzminger, Matthias Kellermeier
OB2-Thu-P16
Relative Stability of S(Se)-Au(111) and S(Se)-Ag(111) Bonding in Aromatic Self-Assembled Monolayers Probed by S-SIMS.
Mateusz Wróbel, Jakub Ossowski, Jakub Rysz, Andreas Terfort, Piotr Cyganik
OB2-Thu-P17
Dipolar carborane self-assembled monolayers on gold as test bench for the study of cationization mechanisms in ToF-SIMS
Laetitia Bernard, Patrik Schmutz, Aliaksei Vetushka, Tomáš Baše
OB2-Thu-P18
Laser Welding of Aluminium and Polyamide: An adhesion Story
Pierre HIRCHENHAHN, Adham AL SAYYAD, Julien BARDON, Peter PLAPPER, Laurent HOUSSIAU
OB3-Thu-P19
An Innovative Strategy to Relieve Hepatic Oxidative Damage Resulted from Chronic Sleep Deprivation: Utilizing Plasmon-Activated Water as a Natural Approach
Fu-Der Mai, Li-You Chen, Ting-Yi Renn, Yu-Chuan Liu, Hung-Ming Chang
OB3-Thu-P20
Application of SIMS Imaging to study localization of drug molecules in biological samples
Samar Aldossari, Allah Detta, Garth S. Cruickshank, Katie L. Moore, Nicholas Lockyer
OB3-Thu-P21
ToF-SIMS monitoring of drug release and dispersion in healthy and osteoporotic rat bone
Marcus Rohnke, Stefanie Pfitzenreuter, boris mogwitz, Anja Henß, Christine Kern, Seemun Ray, Matthias Schumacher, Jürgen Thomas, Juergen Janek
OB3-Thu-P22
Strontium Detection in Bone Sections via ToF-SIMS
Christine Kern, Marcus Rohnke, Nils Döhner, Seemun Ray, Volker Alt, Jürgen Janek
OB3-Thu-P23
3D analysis using delayed extraction for the detection of Ag Nanoparticles in cells
Svenja-Katharina Otto, Marcus Rohnke, Anja Henss, Thaqif ElKhassawna, Katrin Lips, Jürgen Janek
OB3-Thu-P24
The Effect of Copper on the Lipid Membrane of PC12 Cells Measured Using Secondary Ion Mass Spectrometry Imaging
Xianchan Li, Per Malmberg, Andrew G. Ewing
OB3-Thu-P25
Zinc Changes Lipid Composition of Cells and Mediates Plasticity in Exocytosis: Combining ToF SIMS with Electrochemical Quantification
Lin Ren, Masoumeh Dowlatshahi Pour, Per Malmberg, Andrew Ewing
OB3-Thu-P26
Chemotypical differentiation in Pseudomonas aeruginosa microbial communities revealed through C60-SIMS imaging
Sage Dunham, Kisurb Choe, Nameera Baig, Joseph Franklin Ellis, Tianyuan Cao, Nydia Morales-Soto, Joshua Shrout, Paul Bohn, Jonathan Sweedler
Semiconductors, Metals and Nanomaterials
SN1-Thu-P27
The use of time-of-flight secondary ion mass spectrometry for the investigation of hydrogen-induced effects in austenitic steel AISI 304L
Andreas Röhsler, Oded Sobol, Wolfgang E.S. Unger, Thomas Böllinghaus
SN1-Thu-P28
Diffusion of implanted nitrogen in titanium after subsequent annealing analyzed by SIMS
Jan Lorincik, Petr Homola, Klara Rezankova, Petr Vlcak
SN1-Thu-P29
SIMS analysis of silica glasses consecutively implanted with metal and 18O ions
Jan Lorincik, Petr Homola, Klara Rezankova, Sona Vytykacova, Blanka Svecova, Pavla Nekvindova, Anna Mackova, Romana Miksova, Roman Bottger
SN1-Thu-P30
3D light element characterization in corroded Zr alloys using NanoSIMS
Kexue Li, Junliang Liu, Christopher Jones, James Sayers, Thomas Aarholt, Sergio Lozano-Perez, Michael Preuss, Katie Moore, Chris Grovenor
SN1-Thu-P31
Characterization of oxygen diffusion in a long-term SOFC experiment via ToF-SIMS analysis
Priit Möller, Rait Kanarbik, Gunnar Nurk, Freddy Kukk, Enn Lust
SN2-Thu-P32
Dynamic Behavior Analysis of Hydrogen and Lithium in All-solid- state Li+ Ion Secondary Batteries under Charging Using Elastic Recoil Detection
Bun Tsuchiya, Shunya Yamamoto, Katsumi Takahiro, Shinji Nagata
SN2-Thu-P33
Dependence of Hydrogen Storage and Release of Li2ZrO3 on The Density
Bun Tsuchiya, Shunya Yamamoto, Katsumi Takahiro, Shinji Nagata
SN2-Thu-P34
Atmospheric Elements Detection with a few keV Cs Primary Ions Using an IMS 7f SIMS instrument
Shiro Miwa
SN2-Thu-P35
Assessing the concentration and depth distribution of alkali elements in Cu(In,Ga)Se2 based solar cells by dynamic SIMS depth profiling
Benjamin J Hickey, Rouin Farshchi
SN2-Thu-P36
Depth profiling of multijunction solar cell structure
Wawrzyniec Emil Kaszub, Pawel Michalowski, Ewa Dumiszewska, Piotr Knyps, Justyna Grzonka, Wlodzimierz Strupinski
SN2-Thu-P37
ToF-SIMS – SPM combined analysis for real 3D depth profiling of heterogeneous microelectronic structures
Alexis Franquet, Jean Paul Barnes, Valentina Spampinato, M.A. Moreno Villavicencio, Nicolas Chevalier, Thierry Conard, Wilfried Vandervorst
SN2-Thu-P38
Molecular depth profiling with a new Hybrid SIMS instrument for improved molecular identification
Alexander Pirkl, Rudolf Moellers, Henrik Arlinghaus, Derk Rading, Julia Zakel, Ewald Niehuis
SN2-Thu-P39
Interactions of Bi+ primary ions with chalcogens containing Bismuth
Małgorzata Trzyna, Nicolas Berchenko, Rafał Jakieła, Piotr Dziawa, Maciej Kozubal, Józef Cebulski
SN3-Thu-P40
Trace impurities and concentration gradients in multiferroic BiFeO3-BaTiO3 superlattices analyzed by ToF-SIMS
Dietmar Hirsch, Holger Hochmuth, Michael Lorenz, Marius Grundmann
SN3-Thu-P41
Investigation of phase boundaries in Mo/Si periodic multilayer structures by SNMS method
Tomash Sabov, Oleksandr Dubikovskyi, Oleksandr Oberemok, Viktor Melnik
SN3-Thu-P42
Structural characterization of Eu-doped thin film of topological insulator Bi2Te3
Katarzyna Aleksandra Balin, Mateusz Weis, Maciej Zubko, Marcin Wojtyniak, Jacek Szade
SN3-Thu-P43
ToF-SIMS Study of Ruthenium Tris-diimine Sensitized NiO Photocathodes
Corinne Gablin, Nicolas Queyriaux, Jennifer Fize, Vincent Artero, Murielle Chavarot-Kerlidou, Didier Leonard
SN3-Thu-P44
Multitechnique Study of Aminopropyltrimethoxysilane Polysiloxane Network Orientation on Cellulose Nanofibrils Surface
Charlène Reverdy, Corinne Gablin, Didier Leonard, Julien Bras, Naceur Belgacem
SN3-Thu-P45
THE MORPHOLOGY OF THE SURFACE OF FILMS NiSi2/Si OBTAINED BY SOLID-PHASE EPITAXY
Dilnoza Artikbaevna Tashmuhamedova, Maxsuna Bahodirovna Yusupjanova, Jahongirbek Shuxratbek ugli Sodiqjanov, Baltahadja Ermatovich Umirzakov
SN3-Thu-P46
Obtaining of two-layer epitaxial heterostructures CoSi2/Si/CoSi2/Si
Yakub Suvonovich Ergashov, Baltohodja Ermatovich Umirzakov, Dilnoza Artikbaevna Tashmukhamedova
Other Applications
OA1-Thu-P47
Monazite RW-1 standard for SIMS U-Pb and Th-Pb dating
Xiaoxiao Ling, Magdalena Huyskens, Qiu-Li Li, Qin-zhu Yin, Ronald Werner, Yu Liu, Guo-Qiang Tang, Ya-Nan Yang, Xian-Hua Li
OA1-Thu-P48
Simultaneous determination of U-Pb age and REE compositions of zircon by high mass resolution SIMS
Yu Liu, Qiu-li Li, Xian-hua Li, Guo-qiang Tang, Xiao-xiao Ling
OA1-Thu-P49
Combined Analyses of Sulfur Isotopes and Trace Elements in Pyrite with NanoSIMS 50L
Jianchao Zhang, Yangting Lin, Jun Yan, Jinxiang Li, Wei Yang
OA1-Thu-P50
Combined multi-step mineralogical assessment of Pb-Zn-ores. SIMS data as the key information on recovery of strategic metals as by-products
Axel D. Renno, Georgi Belokonov, Quentin Guelennoc, René Ziegenrücker
OA2-Thu-P51
Application of TOF-SIMS in the investigation of Cu,Cr/support mono- and bimetallic catalysts
Aleksandra Paulina Jakubowska, Ewa Józefa Leśniewska, Jacek Przemysław Rogowski, Elżbieta Maćkiewicz, Małgorzata Iwona Szynkowska
OA2-Thu-P52
Potential of a 7eV Energy Offset to Enhance Molecular Interference Reduction during Uranium Isotopic Analysis using a CAMECA IMS 1280
Matvey Aleshin, Thippatai Tanpraphan, Olivier Bildstein, Laure Sangely, Jane Poths
OA2-Thu-P53
Uncertainty Budget Calculations for Uranium Isotopic Analysis of Environmental Particles by CAMECA IMS 1280
Jane Poths, Axel Schwanhaeusser, Laure Sangely, Thippatai Tanpraphan, Olivier Bildstein, Matvey Aleshin
OA2-Thu-P54
Characterizing the Uptake of Silver Nanoparticles (AgNPs) in Plant Tissue by Cryo-Time-of-Flight Secondary Ion Mass Spectrometry and Inductively Coupled Plasma Mass Spectrometry
Angelina Montes, Nita Chavez, Tammy M. Milillo, Diana S. Aga, Mary A. Bisson, Joseph A Gardella
Pushing the Boundaries
PB1-Thu-P55
Development of cluster TOF SIMS in KBSI
Myoung C. Choi, Sang Ju Lee, Chang Min Choi, Jung-Hwan Kim, Eun Ji Park, Ji Young Baek
PB2-Thu-P56
Cluster Ion Laser Secondary Neutral Mass Spectrometry
Marcel Heeger, Andreas Pelster, Bonnie J. Tyler, Heinrich F. Arlinghaus
PB2-Thu-P57
Laser-SNMS analysis for insulating samples
Takeharu Ishikawa, Satoru Nagashima, Takahiro Kashiwagi, Tomoyuki Yamashita, Akio Takano, Suet Yi Liu, Hisataka Takenaka, Jun Nakagawa, Katsumi Endo, Tetsuo Sakamoto, Masaaki Fujii
PB2-Thu-P58
Bevel Depth Profiling by High Spatial Resolution Laser-SNMS
Takahiro Kashiwagi, Takeharu Ishikawa, Satoru Nagashima, Akio Takano, Suet Yi Liu, Hisataka Takenaka, Katsumi Endo, Tetsuo Sakamoto, Masaaki Fujii
PB2-Thu-P59
Matrix and Element Dependences of Ionisation Yield in Laser-SNMS
Reiko Saito, Haruko Akutsu, Jun Asakawa, Shiro Takeno, Satoru Nagashima, Takeharu Ishikawa, Takahiro Kashiwagi, Akio Takano, Tetsuo Sakamoto, Masaaki Fujii
PB3-Thu-P60
Development of in-situ Microtome-based measurement approaches for 3D imaging and depth profiling in ToF-SIMS
Maciej Kawecki, Hans J. Hug, Sasa Vranjkovic, Laetitia Bernard
PB3-Thu-P61
Drug localization at the single cell level - a multimodal mass spectrometry imaging approach
Neda Najafinobar, Lena Von Sydow, Michael Kurczy, Magnus Klarqvist, Per Malmberg
PB3-Thu-P62
Enhancing Sputtering of Daphnia Magna by Argon Gas Cluster Ions and its Implication for Acute Toxicity Mechanism Study
YC Ling, Cho-Hsun Sung, Chi-Hsun Cheng, Chia-Liang Yen, Chiung-Chi Wang
PB3-Thu-P63
Rapid Detection of Edible Vegetable Oils Adulteration and Presence in Food and Fried Oils using TOF-SIMS
YC Ling, Cho-Hsun Sung, Chi-Hsun Cheng, Shin-Hwa Tzing, Chiung-Chi Wang
PB3-Thu-P64
Tracking bacterial molecular footprints using surface mass spectrometry approaches
Alvin Chen Kuang Teo, E. Peter Magennis, Andrew L. Hook, David J. Scurr, Josephine Bunch, Paul Williams, David A. Barrett, Morgan R. Alexander

Announcements

  • 14 November 2017

    Manuscript submission deadline moved to 15 December 2017.
  • 22 September 2017

    Photos taken during the conference can be found here.

    A movie from the Banquet is still to come.
  • 15 September 2017

    SIMS XXII
    20-25 October 2019
    Kyoto, Japan

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