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SIMS21, Poland 2017 - Invited Speakers

Plenary and Invited Speakers

Plenary Speakers

Chris Grovenor, University of Oxford, United Kingdom - "Choosing between high resolution SIMS and Atom Probe Tomography to study key problems in 21st Century materials" - Alfred Benninghoven Plenary Lecture.
Ron Hereen, University of Maastricht, The Netherlands - "SIMS, biology and more: New tools to resolve molecular heterogeneity at surfaces".

Invited Speakers

Melanie Bailey, University of Surrey, England - "ToF-SIMS for imaging latent fingerprints".
Jean-Paul Barnes, CEA, France - "Combining TOF-SIMS with X-ray nanotomography or AFM: fusion of morphological and hyperspectral datasets for nanoelectronic and energy applications".
Anna Belu, Medtronic, USA- "Characterization of Surfaces and Interfaces in the Medical Device Industry".
Luke Hanley, University of Illinois at Chicago, USA - "Photoionization with laser ablation: Implications for SIMS".
Rasmus Havelund, National Physical Laboratory, United Kingdom - "Accurate organic depth profiling".
Paul van der Heide, IMEC, Belgium - "Critical need and future directions of SIMS depth profiling in CMOS device fabrication".
Christine M. Mahoney, Corning, USA - "ToF-SIMS analysis for glass applications".
Satoshi Ninomiya, University of Yamanashi, Japan - "Secondary Ion Yields Produced by Vacuum-type Electrospray Droplet Ion Beams".
Olga S. Ovchinnikova, Oak Ridge National Laboratory, USA - "Visualizing Nanoscale Transformations Through Multimodal Chemical Imaging on a Combined AFM- SIMS Platform".
Nunzio Tuccitto, University of Catania, Italy - "Novel approaches to data mining in molecular depth profiling: from the simulation to sophisticated data treatment".
Martin Whitehouse, Swedish Museum of Natural History, Sweden - "Ion imaging with large-geometry SIMS - novel applications in geochemistry, cosmochemistry and environmental sciences".
Lu-Tao Weng, HKUST, Hong-Kong - "Investigating the stability and structure of spin-coated polymer thin films using ToF-SIMS depth profiling".
Tom Wirtz, Luxembourg Institute of Science and Technology, Luxembourg - "SIMS performed on the Helium Ion Microscope: new prospects for highest spatial resolution imaging and correlative microscopy".
Andreas Wucher, Universität Duisburg-Essen, Germany - "Molecular Ionization Probability in Cluster-SIMS".
Zihua Zhu, Pacific Northwest National Laboratory, USA - "Molecular characterization of electric double layer at electrode-electrolyte interface using in situ liquid SIMS".

Announcements

  • 14 November 2017

    Manuscript submission deadline moved to 15 December 2017.
  • 22 September 2017

    Photos taken during the conference can be found here.

    A movie from the Banquet is still to come.
  • 15 September 2017

    SIMS XXII
    20-25 October 2019
    Kyoto, Japan

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